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Disambiguation of "Lee, Soonyoung"

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Universal Noise Annotation: Unveiling the Impact of Noisy annotation on Object Detection.

, , , , , , , and . CoRR, (2023)

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Xavier Lee Lee

Bongsoo Lee

The role of negative regulators in coordination of the Myxococcus xanthus developmental program. Uni Marburg, (2009)

Min-Hi Lee

Induction and regulation of antiviral defence mechanisms through intracytoplasmic sensors. HU Berlin, (2009)

Sangbok Lee

Nathaniel Lee

 

Other publications of authors with the same name

An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation., , , , and . Microelectron. Reliab., (2017)L-Verse: Bidirectional Generation Between Image and Text., , , , , , , , and . CVPR, page 16505-16515. IEEE, (2022)CEDe: A collection of expert-curated datasets with atom-level entity annotations for Optical Chemical Structure Recognition., , , , , , , , , and 1 other author(s). NeurIPS, (2022)New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler., , , and . ICARCV, page 979-981. IEEE, (2008)Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams., , , , , , , and . IRPS, page 3. IEEE, (2015)Soft Error Issues with Scaling Technologies., , , , , and . Asian Test Symposium, page 68. IEEE Computer Society, (2012)SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET., , , , , and . IRPS, page 1-6. IEEE, (2019)Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit., , , , , , , and . IRPS, page 1. IEEE, (2018)Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices., , , , , , and . IRPS, page 4. IEEE, (2015)An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory., , , and . IEEE Trans. Computers, 63 (8): 2094-2098 (2014)