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The importance of the spacer region to explain short channels mobility collapse in 28nm Bulk and FDSOI technologies.

, , , , , , , , и . ESSDERC, стр. 254-257. IEEE, (2014)

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Frederic Orde

Frederic Folwaczny

Frédéric Robin

Frédéric Ruckert

Frédéric Roux

 

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