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Accelerating the compaction of test sequences in sequential circuits through problem size reduction., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 22 (10): 1443-1449 (2003)Circuit Implementation of a Supply Current Spectrum Test Method., , , , and . IEEE Trans. Instrum. Meas., 59 (10): 2660-2670 (2010)Advanced double-sampling architectures., and . IOLTS, page 130-132. IEEE, (2016)A Nondestructive Method for Accurately Extracting Substrate Parameters of Arbitrary Doping Profile in Nanoscale VLSI., , and . IEEE Trans. Instrum. Meas., 60 (9): 3173-3184 (2011)The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture., and . IEEE Trans. Sustain. Comput., 6 (3): 493-506 (2021)Efficient Static Compaction of Test Sequence Sets through the Application of Set Covering Techniques., and . DATE, page 194-201. IEEE Computer Society, (2004)Wavelet analysis of measurements for on-line testing analog & mixed-signal circuits., , and . IOLTS, page 83-87. IEEE Computer Society, (2010)Wavelet analysis of current measurements for mixed-signal circuit testing., , , and . ISCAS, page 1923-1926. IEEE, (2010)Multiple Parametric Circuit Analysis Tool for Detectability Estimation., , , , and . ICECS, page 1111-1114. IEEE, (2007)Efficient testing of an optical feedback pixel driver using wavelet analysis., , , and . ICECS, page 1041-1044. IEEE, (2010)