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Test Pattern Modification for Average IR-Drop Reduction., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 38-49 (2016)DFT and Minimum Leakage Pattern Generation for Static Power Reduction During Test and Burn-In., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 18 (3): 392-400 (2010)Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (9): 1980-1989 (2014)Diagnosis of single stuck-at faults and multiple timing faults in scan chains.. IEEE Trans. Very Large Scale Integr. Syst., 13 (6): 708-718 (2005)Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns.. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 88-A (4): 1024-1030 (2005)Row-linear feedback shift register-column x-masking technique for simultaneous testing of many-core system chips., , , , , and . IET Comput. Digit. Tech., 5 (4): 238-246 (2011)Test methodology for PCHB/PCFB Asynchronous Circuits., , , , and . ITC, page 1-8. IEEE, (2018)A Multicircuit Simulator Based on Inverse Jacobian Matrix Reuse., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (7): 1130-1137 (2016)Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 24 (11): 1748-1759 (2005)An Asynchronous Design for Testability and Implementation in Thin-film Transistor Technology., and . J. Electron. Test., 27 (2): 193-201 (2011)