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A novel sample reuse methodology for fast statistical simulations with applications to manufacturing variability., and . ISQED, page 672-678. IEEE, (2012)The resilience wall: Cross-layer solution strategies., , , , , , , , , and 3 other author(s). VLSI-DAT, page 1-11. IEEE, (2014)3-D-TCAD-Based Parasitic Capacitance Extraction for Emerging Multigate Devices and Circuits., , and . IEEE Trans. Very Large Scale Integr. Syst., 21 (11): 2094-2105 (2013)Influence and model of gate oxide breakdown on CMOS inverters., , , , and . Microelectron. Reliab., 43 (9-11): 1439-1444 (2003)Guest Editorial Emerging Memories - Technology, Architecture and Applications (Second Issue)., , , and . IEEE J. Emerg. Sel. Topics Circuits Syst., 6 (3): 261-264 (2016)New optimal design strategies and analysis of ultra-low leakage circuits for nano-scale SOI technology., , , , and . ISLPED, page 168-171. ACM, (2003)Phase Noise Analysis of Separately Driven Ring Oscillators., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (11): 4415-4428 (2022)Group LARS-Based Iterative Reweighted Least Squares Methodology for Efficient Statistical Modeling of Memory Designs., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5722-5726 (2022)A scannable pulse-to-static conversion register array for self-timed circuits., , and . IEEE J. Solid State Circuits, 35 (1): 125-128 (2000)A 500-MHz, 32-word×64-bit, eight-port self-resetting CMOS register file., , and . IEEE J. Solid State Circuits, 34 (1): 56-67 (1999)