Author of the publication

Silicon Demonstration of Statistical Post-Production Tuning.

, , , , and . ISVLSI, page 628-633. IEEE Computer Society, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

DFTT: Design for Trojan Test., , and . ICECS, page 1168-1171. IEEE, (2010)Applying the Model-View-Controller Paradigm to Adaptive Test., and . IEEE Des. Test Comput., 29 (1): 28-35 (2012)Integrated optimization of semiconductor manufacturing: A machine learning approach., and . ITC, page 1-10. IEEE Computer Society, (2012)Spatial estimation of wafer measurement parameters using Gaussian process models., , , and . ITC, page 1-8. IEEE Computer Society, (2012)Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction., , , and . ETS, page 35-40. IEEE Computer Society, (2008)Improving Analog and RF Device Yield through Performance Calibration., , , and . IEEE Des. Test Comput., 28 (3): 64-75 (2011)Correlating inline data with final test outcomes in analog/RF devices., , and . DATE, page 812-817. IEEE, (2011)Spatial correlation modeling for probe test cost reduction in RF devices., , , and . ICCAD, page 23-29. ACM, (2012)Silicon Demonstration of Statistical Post-Production Tuning., , , , and . ISVLSI, page 628-633. IEEE Computer Society, (2015)Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models., , , , and . IEEE Des. Test, 32 (1): 53-60 (2015)