Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Aging Compensation in a Class-A High-Frequency Amplifier with DC Temperature Measurements., , , , , and . Sensors, 23 (16): 7069 (August 2023)Discrete and continuous substrate noise spectrum dependence on digital circuit characteristics., , , , , and . ISCAS (5), page 4273-4276. IEEE, (2005)Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling., , , , , , and . ISCAS, page 1-5. IEEE, (2019)Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology., , , , , , , , , and 2 other author(s). PATMOS, page 82-87. IEEE, (2018)A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI., , , , , , , , , and . IEEE J. Solid State Circuits, 54 (2): 476-488 (2019)Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging., , , , , , and . IEEE Trans. Instrumentation and Measurement, 68 (8): 2861-2870 (2019)Behavioural Modelling of DLLs for Fast Simulation and Optimisation of Jitter and Power Consumption., , and . DSD, page 541-547. IEEE Computer Society, (2010)Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches., , , and . ISQED, page 32-38. IEEE, (2014)On the Use of Built-In Temperature Sensors to Monitor Aging in RF Circuits., , , , , and . DCIS, page 1-6. IEEE, (2019)Differential Temperature Sensors: Review of Applications in the Test and Characterization of Circuits, Usage and Design Methodology., , , and . Sensors, 19 (21): 4815 (2019)