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Machine Learning for Test, Diagnosis, Post-Silicon Validation and Yield Optimization.

, , , , , и . ETS, стр. 1-6. IEEE, (2022)

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An experimental analysis of the effectiveness of the circular self-test path technique., , и . EURO-DAC, стр. 246-251. IEEE Computer Society, (1994)A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks., , , и . IEEE Trans. Computers, 69 (1): 87-98 (2020)New techniques for efficiently assessing reliability of SOCs., , , , и . Microelectron. J., 34 (1): 53-61 (2003)On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors., , и . IEEE Trans. Very Large Scale Integr. Syst., 22 (4): 813-823 (2014)RT-Level ITC'99 Benchmarks and First ATPG Results., , и . IEEE Des. Test Comput., 17 (3): 44-53 (2000)New Techniques to Reduce the Execution Time of Functional Test Programs., , , и . IEEE Trans. Computers, 66 (7): 1268-1273 (2017)The Use of Model Checking in ATPG for Sequential Circuits., , , и . CAV, том 531 из Lecture Notes in Computer Science, стр. 86-95. Springer, (1990)An automatic approach to perform the verification of hardware designs according to the ISO26262 functional safety standard., , , , , и . LATS, стр. 1-6. IEEE, (2017)Approximate Equivalence Verification for Protocol Interface Implementation via Genetic Algorithms., , и . EvoWorkshops, том 1596 из Lecture Notes in Computer Science, стр. 182-192. Springer, (1999)FlexFi: A Flexible Fault Injection Environment for Microprocessor-Based Systems., , и . SAFECOMP, том 1698 из Lecture Notes in Computer Science, стр. 323-335. Springer, (1999)