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Application and Analysis of IDDQ Diagnostic Software.

, , and . ITC, page 319-327. IEEE Computer Society, (1997)

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Application and Analysis of IDDQ Diagnostic Software., , and . ITC, page 319-327. IEEE Computer Society, (1997)A Statistical Calculation of Fault Detection Probabilities By Fast Fault Simulation., , , , and . ITC, page 779-784. IEEE Computer Society, (1985)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)., , , , , and . ITC, page 1-10. IEEE Computer Society, (2009)Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment., , , , , , , and . ITC, page 1152-1161. IEEE Computer Society, (1999)Structural and functional test of IBM System z10 chips., , , , , , , , , and 4 other author(s). IBM J. Res. Dev., 53 (1): 5 (2009)Testing the IBM Power 7™ 4 GHz eight core microprocessor., , , , , , , , , and . ITC, page 49-58. IEEE Computer Society, (2010)Weighted random test program generation for a per-pin tester., , , , , , , , , and . ITC, page 1000-1005. IEEE Computer Society, (1990)