Author of the publication

Minimal supervisory structure for flexible manufacturing systems using Petri nets

, , and . 2016 2nd International Conference on Control, Automation and Robotics (ICCAR), page 291--296. IEEE, (April 2016)
DOI: 10.1109/iccar.2016.7486743

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Optimal Supervisory Control for Flexible Manufacturing Systems Model With Petri Nets: A Place-Transition Control., , and . IEEE Access, (2021)Minimal supervisory structure for flexible manufacturing systems using Petri nets, , and . 2016 2nd International Conference on Control, Automation and Robotics (ICCAR), page 291--296. IEEE, (April 2016)A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation., and . Microelectron. Reliab., 49 (9-11): 1096-1102 (2009)Towards a chip level reliability simulator for copper/low-k backend processes., and . DATE, page 279-282. IEEE Computer Society, (2010)Hydrophilic Surface Modification of PDMS Microchannel for O/W and W/O/W Emulsions., , , , and . Micromachines, 6 (10): 1445-1458 (2015)On structural reduction of liveness-enforcing Petri net supervisors for flexible manufacturing systems: an algebraic approach., , , , and . IMA J. Math. Control. Inf., 35 (4): 1217-1249 (2018)A Minimal Supervisory Structure to Optimally Enforce Liveness on Petri Net Models for Flexible Manufacturing Systems., , , , , , and . IEEE Access, (2017)An Improved Method of Particle Swarm Optimization for Path Planning of Mobile Robot., , , , and . J. Control. Sci. Eng., (2020)Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements., and . IEEE Des. Test Comput., 26 (6): 18-27 (2009)Simulation of system backend dielectric reliability., , , , and . Microelectron. J., 45 (10): 1327-1334 (2014)