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Investigating the Use of BICS to detect resistive-open defects in SRAMs., , , , , , and . IOLTS, page 200-201. IEEE Computer Society, (2010)On the Analysis of Routing Cells and Adjacency Faults in CMOS Digital Circuits., , , and . DFT, page 263-270. IEEE Computer Society, (1994)Low power BIST by filtering non-detecting vectors., , , , , , , , , and . ETW, page 165-170. IEEE Computer Society, (1999)Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits., , , , , and . DDECS, page 34-37. IEEE Computer Society, (2008)A Probabilistic Method for the Computation of Testability of RTL Constructs., , , and . DATE, page 176-181. IEEE Computer Society, (2004)Predictive error detection by on-line aging monitoring., , , , , , , and . IOLTS, page 9-14. IEEE Computer Society, (2010)Fault Modeling and Defect Level Projections in Digital ICs., , , and . EDAC-ETC-EUROASIC, page 436-442. IEEE Computer Society, (1994)MOSYS A Methodology for Automatic Object Identification from System Specification., , , , and . ISORC, page 198-201. IEEE Computer Society, (2000)Low-sensitivity to process variations aging sensor for automotive safety-critical applications., , , , , , and . VTS, page 238-243. IEEE Computer Society, (2010)Automatic Configuration of a Medical Imaging System to Unknown Delays in Synchronous Input Data Channels., , , , , , , , and . ISCAS, page 1185-1188. IEEE, (2010)