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Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm.

, , , , and . J. Electron. Test., 7 (3): 145-155 (1995)

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Short test procedures for R-2R D/A converters by electrical modeling and application of the ambiguity algorithm., , , , and . J. Electron. Test., 7 (3): 145-155 (1995)Some thoughts on the word error rate measurement of A/D converters., , , and . ICECS, page 453-456. IEEE, (1998)Uncertainty of mean value and variance obtained from quantized data.. IEEE Trans. Instrumentation and Measurement, 52 (4): 1273-1278 (2003)ADC sinewave histogram testing with quasi-coherent sampling., and . IEEE Trans. Instrumentation and Measurement, 50 (4): 949-953 (2001)Sub-picosecond aperture-uncertainty measurements ADCs.. IEEE Trans. Instrumentation and Measurement, 51 (5): 1039-1044 (2002)Single-Reference Foreground Calibration of High-Resolution, High-Speed Pipeline ADCs., , , and . CSSP, 28 (4): 487-504 (2009)DAC calibration by weighting capacitor rotation in a pipelined ADC., , , and . Circuits, Signals, and Systems, page 31-35. IASTED/ACTA Press, (2005)Cross-correlation noise measurements in A/D converters., and . IEEE Trans. Instrumentation and Measurement, 48 (6): 1282-1286 (1999)Transducer Arrays Over A²B Networks in Industrial and Automotive Applications: Clock Propagation Measurements., , , , , and . IEEE Access, (2021)An Innovative Architecture of Full-Digital Microphone Arrays Over A²B Network for Consumer Electronics., , , , , , and . IEEE Trans. Consumer Electron., 68 (3): 200-208 (2022)