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Disambiguation of "Lim, Hyeonchan"

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Test data reduction method based on berlekamp-massey algorithm.

, , , and . ISOCC, page 123-124. IEEE, (2017)

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Hans Lim

Frans Lim

Minha Lim

Soyoung Lim

Rastoni Lim

 

Other publications of authors with the same name

A Hybrid Test Scheme for Automotive IC in Multisite Testing., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5671-5680 (2022)Grouping-Based TSV Test Architecture for Resistive Open and Bridge Defects in 3-D-ICs., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (10): 1759-1763 (2017)Broadcast scan compression based on deterministic pattern generation algorithm., , , and . ISQED, page 449-453. IEEE, (2017)Test data reduction method based on berlekamp-massey algorithm., , , and . ISOCC, page 123-124. IEEE, (2017)Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs., , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (6): 1164-1177 (2021)Scan Cell Modification for Intra Cell-Aware Scan Chain Diagnosis., , and . IEEE Trans. Circuits Syst. II Express Briefs, 69 (11): 4498-4502 (2022)A Software-based Scan Chain Diagnosis for Double Faults in A Scan Chain., , and . ISOCC, page 265-266. IEEE, (2018)Robust Secure Shield Architecture for Detection and Protection Against Invasive Attacks., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (10): 3023-3034 (2020)Logic Diagnosis Based on Deep Learning for Multiple Faults., , , , and . ISOCC, page 366-367. IEEE, (2022)Cell-Aware Scan Diagnosis Using Partially Synchronous Set and Reset., , , and . ISOCC, page 121-122. IEEE, (2022)