Author of the publication

0.5-V Input Digital Low-Dropout Regulator (LDO) with 98.7% Current Efficiency in 65 nm CMOS.

, , , , , , , and . IEICE Trans. Electron., 94-C (6): 938-944 (2011)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A 100 Mbps, 4.1 pJ/bit Threshold Detection-Based Impulse Radio UWB Transceiver in 90 nm CMOS., , , , , , , and . IEICE Trans. Electron., 92-C (6): 769-776 (2009)Power Supply Voltage Dependence of Within-Die Delay Variation of Regular Manual Layout and Irregular Place-and-Route Layout., , , , and . IEICE Trans. Electron., 94-C (6): 1072-1075 (2011)Low Power VLSI Circuit Design with Fine-Grain Voltage Engineering., and . IPSJ Trans. Syst. LSI Des. Methodol., (2009)Power distribution analysis of VLSI interconnects using model orderreduction., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (6): 739-745 (2002)High-Speed Searching of Optimum Switching Pattern for Digital Active Gate Drive to Adapt to Various Load Conditions., , , , , , , and . IEEE Trans. Ind. Electron., 69 (5): 5185-5194 (2022)Statistical leakage current reduction in high-leakage environments using locality of block activation in time domain., , and . IEEE J. Solid State Circuits, 39 (9): 1497-1503 (2004)A 6.78-MHz Multiple-Transmitter Wireless Power Transfer System With Efficiency Maximization by Adaptive Magnetic Field Adder IC., , and . IEEE J. Solid State Circuits, 57 (8): 2390-2403 (2022)A super cut-off CMOS (SCCMOS) scheme for 0.5-V supply voltage with picoampere stand-by current., , and . IEEE J. Solid State Circuits, 35 (10): 1498-1501 (2000)A low voltage buck DC-DC converter using on-chip gate boost technique in 40nm CMOS., , , , , , , and . ASP-DAC, page 109-110. IEEE, (2013)An on-chip characterizing system for within-die delay variation measurement of individual standard cells in 65-nm CMOS., , , and . ASP-DAC, page 109-110. IEEE, (2011)