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Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.

Y. Fu, H. Wong, and J. Liou. Microelectron. Reliab., 47 (1): 46-50 (2007)

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Walter Wong

Limsoon Wong

Sung-Hei Hong

Ka Hei Lui

Wei-chwen Wong

Other publications of authors with the same name

Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures.V. Filip, H. Wong, and D. Nicolaescu. Microelectron. Reliab., 46 (7): 1027-1034 (2006)High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs.Y. Liu, X. Li, R. Cheung, S. Chan, and H. Wong. IEEE Trans. Circuits Syst. II Express Briefs, 65-II (6): 794-798 (2018)Temperature dependences of threshold voltage and drain-induced barrier lowering in 60 nm gate length MOS transistors.Z. Chen, H. Wong, Y. Han, S. Dong, and B. Yang. Microelectron. Reliab., 54 (6-7): 1109-1114 (2014)A double snapback SCR ESD protection scheme for 28 nm CMOS process.T. Hu, S. Dong, H. Jin, H. Wong, Z. Xu, X. Li, and J. Liou. Microelectron. Reliab., (2018)Silicon oxynitride integrated waveguide for on-chip optical interconnects applications.C. Wong, H. Wong, M. Chan, Y. Chow, and H. Chan. Microelectron. Reliab., 48 (2): 212-218 (2008)Editorial.E. Leelarasmee, and H. Wong. Journal of Circuits, Systems, and Computers, (2013)A Wideband three-stage rail-to-rail power amplifier driving large capacitive load.W. Tam, O. Wong, C. Kok, H. Wong, and A. Wang. APCCAS, page 1394-1397. IEEE, (2008)Ultra-shallow n+p junction formed by PH3 and AsH3 plasma immersion ion implantation.B. Yang, N. Cheung, S. Denholm, J. Shao, H. Wong, P. Lai, and Y. Cheng. Microelectron. Reliab., 42 (12): 1985-1989 (2002)Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation.W. Tam, S. Siu, B. Yang, C. Kok, and H. Wong. Microelectron. Reliab., 51 (12): 2064-2068 (2011)Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure.W. Tam, O. Wong, T. Ng, C. Kok, and H. Wong. Microelectron. Reliab., 50 (5): 622-626 (2010)

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Disambiguation of "Wong, Hei"

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Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.

Please choose a person to relate this publication to

Walter Wong

Limsoon Wong

Sung-Hei Hong

Ka Hei Lui

Wei-chwen Wong

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wong, Hei"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.

Please choose a person to relate this publication to

Walter Wong

Limsoon Wong

Sung-Hei Hong

Ka Hei Lui

Wei-chwen Wong

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.