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Condensed Linear Feedback Shift Register (LFSR) Testing - A Pseudoexhaustive Test Technique.

, and . IEEE Trans. Computers, 35 (4): 367-370 (1986)

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Pseudorandom Testing., , and . IEEE Trans. Computers, 36 (3): 332-343 (1987)Logic Design of Multivalued I2L Logic Circuits.. IEEE Trans. Computers, 28 (8): 546-559 (1979)Built-In Verification Test.. ITC, page 183-190. IEEE Computer Society, (1982)An Analysis of the Multiple Fault Detection Capabilities of Single Stuck-at Fault Test Sets., and . ITC, page 52-58. IEEE Computer Society, (1984)Test Teaching.. ITC, page 235. IEEE Computer Society, (1985)An Experimental Study Comparing 74LS181 Test Sets., , and . COMPCON, page 384-387. IEEE Computer Society, (1985)Verification testing.. DAC, page 495-500. ACM/IEEE, (1982)Bounds on Signature Analysis Aliasing for Random Testing., , and . FTCS, page 104-113. IEEE Computer Society, (1991)Iterative Combinational Switching Networksߞ General Design Considerations.. IRE Trans. Electron. Comput., 7 (4): 285-291 (1958)Summary of Structural integrity Checking., , and . RTSS, page 107-109. IEEE Computer Society, (1980)