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Disambiguation of "Ting, Hsin-Wen"

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Histogram Based Testing Strategy for ADC.

, , and . ATS, page 51-54. IEEE, (2006)

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Wen-tsi Ting

Wen-Yuan Ting

Wenjung Hsing

Chi-Wu Hsing

Ed Huai hsin Chi

 

Other publications of authors with the same name

Transition-Code Based Linearity Test Method for Pipelined ADCs With Digital Error Correction., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2158-2169 (2011)An Output Response Analyzer Circuit for ADC Built-in Self-Test.. J. Electron. Test., 27 (4): 455-464 (2011)Digital Design-for-Diagnosis Method for Error Identification of Pipelined ADCs., and . J. Electron. Test., 27 (6): 697-709 (2011)Six-bit 2.7-GS/s 5.4-mW Nyquist complementary metal-oxide semiconductor digital-to-analogue converter for ultra-wideband transceivers., , and . IET Circuits Devices Syst., 6 (2): 95-102 (2012)A Digital Testing Strategy for Characterizing an Analog Circuit Block.. IEEE Trans. Instrumentation and Measurement, 65 (6): 1374-1384 (2016)A capacitance-ratio quantification design for linearity test in differential top-plate sampling sar ADCS., , , and . I. J. Circuit Theory and Applications, 43 (10): 1333-1350 (2015)Histogram Based Testing Strategy for ADC., , and . ATS, page 51-54. IEEE, (2006)A Time Domain Built-In Self-Test Methodology for SNDR and ENOB Tests of Analog-to-Digital Converters., , and . Asian Test Symposium, page 52-57. IEEE Computer Society, (2004)A SAR ADC BIST for simplified linearity test., , and . SoCC, page 146-149. IEEE, (2011)A Histogram-Based Testing Method for Estimating A/D Converter Performance., , and . IEEE Trans. Instrumentation and Measurement, 57 (2): 420-427 (2008)