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Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source.

, , and . IEEE Trans. Instrumentation and Measurement, 61 (11): 3024-3030 (2012)

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Simulation of a QMS Including the Effects of Pressure in the Electron-Impact Ion Source., , and . IEEE Trans. Instrumentation and Measurement, 61 (11): 3024-3030 (2012)