( en | de | ru )

 

Disambiguation of "Koren, Israel"

Author of the publication

copydeleteadd this publication to your clipboard
Detecting Faults in Four Symmetric Key Block Ciphers.

, , and . ASAP, page 258-268. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Hillel Koren

Christoph Korenke

Sergey Koren

Viktoria Koren

Aleksej Korenkov

 

Other publications of authors with the same name

Countermeasures against fault attacks on software implemented AES: effectiveness and cost., , , , and . WESS, page 7. ACM, (2010)Countermeasures against Branch Target Buffer Attacks., , , and . FDTC, page 75-79. IEEE Computer Society, (2007)Connectivity and performance tradeoffs in the cascade correlation learning architecture., and . IEEE Trans. Neural Networks, 5 (6): 930-935 (1994)Exploring the Feasibility of Low Cost Fault Injection Attacks on Sub-threshold Devices through an Example of a 65nm AES Implementation., , , , , and . RFIDSec, volume 7055 of Lecture Notes in Computer Science, page 48-60. Springer, (2011)Application-Level Fault Tolerance as a Complement to System-Level Fault Tolerance., , , and . J. Supercomput., 16 (1-2): 53-68 (2000)A Combined Design-Time/Test-Time Study of the Vulnerability of Sub-Threshold Devices to Low Voltage Fault Attacks., , , , , and . IEEE Trans. Emerg. Top. Comput., 2 (2): 107-118 (2014)Error Analysis and Detection Procedures for a Hardware Implementation of the Advanced Encryption Standard., , , , and . IEEE Trans. Computers, 52 (4): 492-505 (2003)Does the Sharing of Execution Units Improve Performance/Power of Multicores?, , and . ACM Trans. Embed. Comput. Syst., 14 (1): 17:1-17:24 (2015)Effective analytical delay model for transistor sizing., and . ASP-DAC, page 387-392. ACM Press, (2005)Online Inertia-Based Temperature Estimation for Reliability Enhancement., , and . J. Low Power Electron., 12 (3): 159-171 (2016)