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Disambiguation of "Nahar, Amit"

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Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

, , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2120-2133 (2017)

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Regina Amith-Borchart

Menachem Amitai

Hazem al- Nahar

Samuel Amiteye

Menachem Amitai

 

Other publications of authors with the same name

What we know after twelve years developing and deploying test data analytics solutions., , and . ITC, page 1-8. IEEE, (2016)Harnessing process variations for optimizing wafer-level probe-test flow., , , , , and . ITC, page 1-8. IEEE, (2016)A machine learning approach to fab-of-origin attestation., , , , , and . ICCAD, page 92. ACM, (2016)Harnessing fabrication process signature for predicting yield across designs., , , , , and . ISCAS, page 898-901. IEEE, (2016)Yield prognosis for fab-to-fab product migration., , , , , , and . VTS, page 1-6. IEEE Computer Society, (2015)Predicting die-level process variations from wafer test data for analog devices: A feasibility study., , , , , and . LATW, page 1-6. IEEE Computer Society, (2013)Burn-in reduction using principal component analysis., , and . ITC, page 10. IEEE Computer Society, (2005)Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs., , , , and . VTS, page 1-6. IEEE Computer Society, (2016)Statistical outlier screening as a test solution health monitor., , , and . ITC, page 1-10. IEEE, (2016)Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing., , , , , and . VTS, page 1-7. IEEE, (2023)