Author of the publication

A 40-to-80MHz Sub-4μW/MHz ULV Cortex-M0 MCU SoC in 28nm FDSOI With Dual-Loop Adaptive Back-Bias Generator for 20μs Wake-Up From Deep Fully Retentive Sleep Mode.

, , , , , , , , and . ISSCC, page 322-324. IEEE, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A 0.4V 0.08fJ/cycle retentive True-Single-Phase-Clock 18T Flip-Flop in 28nm FDSOI CMOS., and . ISCAS, page 1-4. IEEE, (2017)CAMEL: An Ultra-Low-Power VGA CMOS Imager based on a Time-Based DPS Array., , , , , and . ICDSC, page 155-159. ACM, (2016)Enhancing the Reliability of Dense LoRaWAN Networks With Multi-User Receivers., , , , and . IEEE Open J. Commun. Soc., (2021)Comprehensive Analytical Comparison of Ring Oscillators in FDSOI Technology: Current Starving Versus Back-Bias Control., , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (5): 1883-1895 (2022)Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics., , , and . DATE, page 195-200. IEEE, (2018)Assessing the embodied carbon footprint of IoT edge devices with a bottom-up life-cycle approach., and . CoRR, (2021)Efficient Multiple-Valued Signed-Digit Full Adder Based on NDR MOS Structures and its Application to an N-bit Current-Mode Constant-Time Adder., , , , and . J. Multiple Valued Log. Soft Comput., 13 (1-2): 61-78 (2007)A 0.4-V 0.66-fJ/Cycle Retentive True-Single-Phase-Clock 18T Flip-Flop in 28-nm Fully-Depleted SOI CMOS., and . IEEE Trans. Circuits Syst. I Regul. Pap., 65-I (3): 935-945 (2018)Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications., , and . VLSI-SoC, page 1-6. IEEE, (2016)The Environmental Footprint of IC Production: Meta-Analysis and Historical Trends., , , , , and . ESSDERC, page 352-355. IEEE, (2022)