Author of the publication

The impact of electromigration in copper interconnects on power grid integrity.

, and . DAC, page 88:1-88:6. ACM, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Predicting electromigration mortality under temperature and product lifetime specifications., and . DAC, page 43:1-43:6. ACM, (2016)Analyzing the electromigration effects on different metal layers and different wire lengths., , , and . ICECS, page 682-685. IEEE, (2014)Circuit delay variability due to wire resistance evolution under AC electromigration., and . IRPS, page 3. IEEE, (2015)A systematic approach for analyzing and optimizing cell-internal signal electromigration., , , , and . ICCAD, page 486-491. IEEE, (2014)Reducing the signal Electromigration effects on different logic gates by cell layout optimization., , , , , and . LASCAS, page 1-4. IEEE, (2015)Lottery-Based Payment Mechanism for Microtasks., , and . HCOMP (Works in Progress / Demos), volume WS-13-18 of AAAI Technical Report, AAAI, (2013)The impact of electromigration in copper interconnects on power grid integrity., and . DAC, page 88:1-88:6. ACM, (2013)Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture., , and . DAC, page 31:1-31:6. ACM, (2016)Autopilot design for A class of miniature autonomous blimps., , , , , , , and . CCTA, page 841-846. IEEE, (2017)American sign language recognition using HAAR type classifier., , , and . KES Journal, 19 (1): 63-68 (2015)