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Mitigating switching variability in carbon nanotube memristors., , , , , , , , , and 3 other author(s). IRPS, page 1-4. IEEE, (2021)Variability and disturb sources in ferroelectric 3D NANDs and comparison to Charge-Trap equivalents., , , , , , , and . IMW, page 1-4. IEEE, (2022)Efficient parametrization of complex molecule-surface force fields., , , and . J. Comput. Chem., 36 (16): 1187-1195 (2015)On the volatility of oxide defects: Activation, deactivation, and transformation., , , , , , and . IRPS, page 5. IEEE, (2015)QM/MM method for metal-organic interfaces., , , and . J. Comput. Chem., 31 (16): 2955-2966 (2010)Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence., , , , , , and . Microelectron. Reliab., (2018)Towards a Universal Model of Dielectric Breakdown., , , , , and . IRPS, page 1-8. IEEE, (2023)Combining measurements and modeling/simulations analysis to assess carbon nanotube memory cell characteristics., , , , , , , , , and 2 other author(s). IRPS, page 36-1. IEEE, (2022)Hydrogen Induced Dipole Layer in Pd-SiO2 Based Gas Sensors., , , , , and . SAS, page 1-6. IEEE, (2022)Theories of scanning probe microscopes at the atomic scale, , and . Rev. Mod. Phys., 75 (4): 1287--1331 (October 2003)