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Mass-loaded cantilevers with suppressed higher-order modes for magnetic resonance force microscopy

, , , , , and . TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003, 2, page 1120--1123. IEEE, (2003)

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Surface modification with the scanning tunneling microscope., , , and . IBM J. Res. Dev., 30 (5): 492-499 (1986)Mass-loaded cantilevers with suppressed higher-order modes for magnetic resonance force microscopy, , , , , and . TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003, 2, page 1120--1123. IEEE, (2003)