( en | de | ru )

 

Disambiguation of "Ogasahara, Yasuhiro"

Author of the publication

copydeleteadd this publication to your clipboard
Standard cell implementation of buskeeper PUF with symmetric inverters and neighboring cells for passing randomness tests.

, , and . GCCE, page 550-551. IEEE, (2015)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yasuhiro Murakawa

Yasuhiro Arahata

Yasuhiro Shirasaki

 

Other publications of authors with the same name

Impact of well edge proximity effect on timing., , , , , , and . ESSCIRC, page 115-118. IEEE, (2007)All-Digital Ring-Oscillator-Based Macro for Sensing Dynamic Supply Noise Waveform., , and . IEEE J. Solid State Circuits, 44 (6): 1745-1755 (2009)A Silicon-on-Thin-Buried-Oxide CMOS Microcontroller with Embedded Atom-Switch ROM., , , , , , , , , and 8 other author(s). IEEE Micro, 35 (6): 13-23 (2015)Impacts of flexible Vth control, low process variability, and steep SS with low on-current of new structure transistors to ultra-low voltage designs., , , , and . IEICE Electron. Express, 12 (15): 20150460 (2015)Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification., , and . ASP-DAC, page 107-108. IEEE, (2008)Prototype of USB stick-sized PUF module for authentication and key generation., , and . GCCE, page 1-2. IEEE, (2017)Implementation of pseudo linear feedback shift register physical unclonable function on silicon., , and . ISCAS, page 758-761. IEEE, (2016)Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect., , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 90-A (4): 724-731 (2007)Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge-Response pair acquisition using Built-In Self-Test before shipping., , , , , , and . Integr., (2020)Measurement and analysis of delay variation due to inductive coupling., , and . CICC, page 305-308. IEEE, (2005)