From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

When bad things happen to good chips (panel session)., , , , , , , и . DAC, стр. 736-737. ACM, (2000)A 32nm 0.5V-supply dual-read 6T SRAM., , , , , , , , , и 5 other автор(ы). CICC, стр. 1-4. IEEE, (2010)Smart grid load balancing techniques via simultaneous switch/tie-line/wire configurations., , , , и . ICCAD, стр. 382-388. IEEE, (2014)Analyzing the impact of process variations on parametric measurements: Novel models and applications., и . DATE, стр. 375-380. IEEE, (2009)Variation-aware analysis: savior of the nanometer era?, , , , , и . DAC, стр. 411-412. ACM, (2006)Design Variability: Challenges and Solutions at Microarchitecture-Architecture Level., и . DATE, ACM, (2008)A More Effective CEFF., и . ISQED, стр. 648-653. IEEE Computer Society, (2005)Time-Domain Simulation of Variational Interconnect Models., , , и . ISQED, стр. 419-424. IEEE Computer Society, (2002)Timing Yield Estimation from Static Timing Analysis., , , и . ISQED, стр. 437-442. IEEE Computer Society, (2001)A Root-Finding Method for Assessing SRAM Stability., , , , и . ISQED, стр. 804-809. IEEE Computer Society, (2008)