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Disambiguation of "Renovell, Michel"

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On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring.

, , , and . IOLTS, page 233-238. IEEE Computer Society, (2008)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Michel Georg Michel

Michel Ghazal

Prognostische Relevanz der Schildwächterlymphknotenbiopsie beim malignen Melanom. MedH Hannover, (2009)

Christine Michel

Malaise dans l'érotisme: Darstellungen sexueller Praktiken und Formen in der französischsprachigen Literatur der Gegenwart. Uni Marburg, (2008)

Friedrich Michel

Eugen Michel

 

Other publications of authors with the same name

Guest Editorial., , and . J. Electron. Test., 21 (3): 203 (2005)A high accuracy triangle-wave signal generator for on-chip ADC testing., , , and . ETW, page 89-94. IEEE Computer Society, (2002)Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC., , , , , and . IET Comput. Digit. Tech., 1 (3): 146-153 (2007)New implementions of predictive alternate analog/RF test with augmented model redundancy., , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)A DFT Technique to Improve ATPG Efficiency for Sequential Circuits., , and . VLSI Design, page 51-54. IEEE Computer Society, (1993)TI-BIST: a temperature independent analog BIST for switched-capacitor filters., , , , , and . Asian Test Symposium, page 78-83. IEEE Computer Society, (2000)Different experiments in test generation for XILINX FPGAs., and . ITC, page 854-862. IEEE Computer Society, (2000)Test configurations to enhance the testability of sequential circuits., , , and . Asian Test Symposium, page 160-168. IEEE Computer Society, (1995)Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits., , and . ATS, page 239-244. IEEE, (2007)A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency., , , , and . ATS, page 273-278. IEEE, (2006)