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Generation and compaction of mixed broadside and skewed-load n-detection test sets for transition faults.

. DFT, page 37-42. IEEE Computer Society, (2012)

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On Interconnecting Circuits with Multiple Scan Chains for Improved Test Data Compression., and . VLSI Design, page 741-744. IEEE Computer Society, (2004)Tuple Detection for Path Delay Faults: A Method for Improving Test Set Quality., and . VLSI Design, page 41-46. IEEE Computer Society, (2005)TEMPLATES: A Test Generation Procedure for Synchronous Sequential Circuits., and . Asian Test Symposium, page 74-. IEEE Computer Society, (1997)Static Test Compaction for Scan-Based Designs to Reduce Test Application Time., and . Asian Test Symposium, page 198-203. IEEE Computer Society, (1998)A method to enhance the fault coverage obtained by output response comparison of identical circuits., and . ITC, page 196-203. IEEE Computer Society, (2001)Static compaction for two-pattern test sets., and . Asian Test Symposium, page 222-228. IEEE Computer Society, (1995)Low-Complexity Fault Diagnosis Under the Multiple Observation Time Testing Approach., and . Asian Test Symposium, page 226-231. IEEE Computer Society, (1996)On Test Generation for Interconnected Finite-State Machines: The Input Sequence Propagation Problem., and . Asian Test Symposium, page 16-21. IEEE Computer Society, (1996)On the saturation of n-detection test sets with increased n., and . ITC, page 1-10. IEEE Computer Society, (2007)Aliasing computation using fault simulation with fault dropping., and . VTS, page 282-288. IEEE Computer Society, (1993)