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Disambiguation of "Laffont, Romain"

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MM11 based flash memory cell model including characterization procedure.

, , , , , , and . ISCAS, IEEE, (2006)

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Romain Schroeder

Romain Brevet

Romain Bourqui

Romain Aïssat

Pierre-Yves Laffont

 

Other publications of authors with the same name

A Modelisation of the temperature dependence of the Fowler-Nordheim current in EEPROM memories., , , , and . Microelectron. Reliab., 49 (9-11): 1070-1073 (2009)DCG-FGT transistor: Retention study of Floating Gate charge., , , , , and . MWSCAS, page 825-827. IEEE, (2013)A new adustable Schmitt Trigger based on Dual Control Gate-Floating Gate Transistor (DCG-FGT)., , , , , and . MWSCAS, page 643-645. IEEE, (2012)PSP based DCG-FGT transistor model including characterization procedure., , , , , and . ICECS, page 228-231. IEEE, (2011)Investigation of the effects of constant voltage stress on thin SiO2 layers using dynamic measurement protocols., , , , , , , and . Microelectron. Reliab., 52 (9-10): 1895-1900 (2012)A new method to quantify retention-failed cells of an EEPROM CAST., , , , , , and . Microelectron. Reliab., 47 (9-11): 1609-1613 (2007)Effect of AC stress on oxide TDDB and trapped charge in interface states., , , , and . ISIC, page 416-419. IEEE, (2014)Decreasing EEPROM Programming Bias With Negative Voltage, Reliability Impact., , , , and . MTDT, page 168-176. IEEE Computer Society, (2002)MM11 based flash memory cell model including characterization procedure., , , , , , and . ISCAS, IEEE, (2006)Leakage paths identification in NVM using biased data retention., , , , , and . Microelectron. Reliab., 50 (9-11): 1474-1478 (2010)