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Defect Characterization of Spintronic-based Neuromorphic Circuits., и . IOLTS, стр. 1-4. IEEE, (2020)Testing Scouting Logic-Based Computation-in-Memory Architectures., , , , , и . ETS, стр. 1-6. IEEE, (2020)Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale., , , , , и . CoRR, (2023)Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations., , , , и . CoRR, (2024)One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection., и . CoRR, (2023)Time-Dependent Electromigration Modeling for Workload-Aware Design-Space Exploration in STT-MRAM., , , , , , , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (12): 5327-5332 (2022)Runtime Identification of Hardware Trojans by Feature Analysis on Gate-Level Unstructured Data and Anomaly Detection., , и . ACM Trans. Design Autom. Electr. Syst., 25 (4): 33:1-33:23 (2020)A Printed Camouflaged Cell Against Reverse Engineering of Printed Electronics Circuits., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 28 (11): 2448-2458 (2020)A Survey of Test and Reliability Solutions for Magnetic Random Access Memories., , , , , и . Proc. IEEE, 109 (2): 149-169 (2021)Security Challenges and Opportunities of Cloud FPGAs.. CCSW@CCS, стр. 1. ACM, (2023)