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DFM Evaluation Using IC Diagnosis Data., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (3): 463-474 (2017)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)CAD at the Design-Manufacturing Interface., , , , , and . DAC, page 321-326. ACM Press, (1997)Testability-oriented channel routing., , , , and . VLSI Design, page 208-213. IEEE Computer Society, (1995)Design-Manufacturing Interface: Part II - Applications., , , , , and . DATE, page 557-562. IEEE Computer Society, (1998)DREAMS: DFM rule EvAluation using manufactured silicon., , , , , and . ICCAD, page 99-106. IEEE, (2013)Testing oriented analysis of CMOS ICs with opens., , and . ICCAD, page 344-347. IEEE Computer Society, (1988)Design for manufacturability in submicron domain., , , and . ICCAD, page 690-697. IEEE Computer Society / ACM, (1996)Hierarchical extraction of critical area for shorts in very large ICs., and . DFT, page 19-27. IEEE Computer Society, (1995)Modeling the Economics of Testing: A DFT Perspective., , , , and . IEEE Des. Test Comput., 19 (1): 29-41 (2002)