Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Hierarchical testing using precomputed tests for modules.. University of Michigan, USA, (1994)Providing convincing evidence of safety in X-by-wire automotive systems., , and . HASE, page 189-192. IEEE Computer Society, (2000)Optimal Space Compaction of Test Responses., , and . ITC, page 834-843. IEEE Computer Society, (1995)Test Width Compression for Built-In Self Testing., , , and . ITC, page 328-337. IEEE Computer Society, (1997)Online BIST for Embedded Systems., , and . IEEE Des. Test Comput., 15 (4): 17-24 (1998)Test Propagation Through Modules and Circuits., and . ITC, page 748-757. IEEE Computer Society, (1991)Hierarchical test generation using precomputed tests for modules., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 9 (6): 594-603 (1990)Low-Cost On-Line Fault Detection Using Control Flow Assertions., , and . IOLTS, page 137-143. IEEE Computer Society, (2003)Time-Constrained Failure Diagnosis in Distributed Embedded Systems., , and . DSN, page 449-458. IEEE Computer Society, (2002)Hierarchical Test Generation Using Precomputed Tests for Modules., and . ITC, page 221-229. IEEE Computer Society, (1988)