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Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits.

, , , and . ISPD, page 160-167. ACM, (2018)

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Designing Low-Power Embedded Software for Mass-Produced Microprocessor by Using a Loop Table in On-Chip Memory., , and . PATMOS, volume 3728 of Lecture Notes in Computer Science, page 59-68. Springer, (2005)Novel transient-fault detection circuit featuring enhanced bulk built-in current sensor with low-power sleep-mode., , , , and . Microelectron. Reliab., 52 (9-10): 1781-1786 (2012)Improving the ability of Bulk Built-In Current Sensors to detect Single Event Effects by using triple-well CMOS., , , , , , and . Microelectron. Reliab., 54 (9-10): 2289-2294 (2014)Design of a soft-error robust microprocessor., , and . Microelectron. J., 40 (7): 1062-1068 (2009)Detection of Layout-Level Trojans by Monitoring Substrate with Preexisting Built-in Sensors., , and . ISVLSI, page 290-295. IEEE Computer Society, (2017)Standard CAD Tool-Based Method for Simulation of Laser-Induced Faults in Large-Scale Circuits., , , and . ISPD, page 160-167. ACM, (2018)Non-intrusive testing technique for detection of Trojans in asynchronous circuits., , , and . DATE, page 1516-1519. IEEE, (2018)Design at high level of a robust 8-bit microprocessor to soft errors by using only standard gates., , and . SBCCI, page 196-201. ACM, (2006)A Distributed Body-Biasing Strategy for Asynchronous Circuits., , , , , , , , and . VLSI-SoC, page 27-32. IEEE, (2019)Towards high-sensitive built-in current sensors enabling detection of radiation-induced soft errors., , and . Microelectron. Reliab., (2017)