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Design for Testability Based on Single-Port-Change Delay Testing for Data Paths.

, , , и . Asian Test Symposium, стр. 254-259. IEEE Computer Society, (2005)

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Satoshi Ejima

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Satoshi Nishida

 

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Design for Testability Based on Single-Port-Change Delay Testing for Data Paths., , , и . Asian Test Symposium, стр. 254-259. IEEE Computer Society, (2005)A DFT Method for RTL Data Paths Based on Partially Strong Testability to Guarantee Complete Fault Efficiency., , , и . Asian Test Symposium, стр. 306-311. IEEE Computer Society, (2005)A Method of Diagnostic Test Generation for Transition Faults., и . PRDC, стр. 273-278. IEEE Computer Society, (2015)A Synthesis Method to Alleviate Over-Testing of Delay Faults Based on RTL Don't Care Path Identification., , , и . VTS, стр. 71-76. IEEE Computer Society, (2009)Delay Testing: Improving Test Quality and Avoiding Over-testing., , и . Inf. Media Technol., 6 (4): 1053-1066 (2011)An approach to LFSR-based X-masking for built-in self-test., и . LATS, стр. 1-4. IEEE, (2017)Factory Environment Monitoring: A Japanese Tea Manufacturer's Case., и . ICCE, стр. 1-3. IEEE, (2019)Fast false path identification based on functional unsensitizability using RTL information., , , и . ASP-DAC, стр. 660-665. IEEE, (2009)Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation., , и . VLSI-SoC (Selected Papers), том 249 из IFIP, стр. 301-316. Springer, (2006)A Method of Controlling Devices Remotely in Online Embedded System Engineer Training., и . ICCE-Taiwan, стр. 495-496. IEEE, (2023)