Author of the publication

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

, , , , , , , and . DFT, page 1-6. IEEE, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions., , , , , , , , , and 2 other author(s). CoRR, (2023)Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study., , , , , , , and . DTIS, page 1-6. IEEE, (2021)Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip., , , , , , and . DFT, page 1-6. IEEE, (2022)An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices., , , , , , , , , and 1 other author(s). DSN (Supplements), page 92-97. IEEE, (2020)Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs., , , , , , and . DFT, page 1-6. IEEE, (2023)Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node., , , , , , , and . IRPS, page 1-5. IEEE, (2020)Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems., , , , , , , and . DFT, page 1-6. IEEE, (2020)Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications., , , , , , , , , and . ETS, page 1-6. IEEE, (2020)An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?, , , , , and . ETS, page 1-6. IEEE, (2023)Characterization of a RISC-V System-on-Chip under Neutron Radiation., , , , , , and . DTIS, page 1-6. IEEE, (2021)