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Disambiguation of "Tsai, Kun-Han"

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Delay Fault Diagnosis Using Timing Information.

, , , and . ISQED, page 485-490. IEEE Computer Society, (2004)

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Kun-Han Lin

Ming-Han Tsai

Schi-chien Tsai

Yuan-feen Tsai

Wei-Ding Tsai

 

Other publications of authors with the same name

Online slack-time binning for IO-registered die-to-die interconnects., , , , , and . ITC, page 1-8. IEEE, (2016)Pulse-Vanishing Test for Interposers Wires in 2.5-D IC., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (8): 1258-1268 (2014)Circuit and Methodology for Testing Small Delay Faults in the Clock Network., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (10): 2087-2097 (2018)Parametric Delay Test of Post-Bond Through-Silicon Vias in 3-D ICs via Variable Output Thresholding Analysis., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (5): 737-747 (2013)Analysis and methodology for multiple-fault diagnosis., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (3): 558-575 (2006)Oscillation-Based Prebond TSV Test., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (9): 1440-1444 (2013)Improving the Resolution of Single-Delay-Fault Diagnosis., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (5): 932-945 (2008)Small delay testing for TSVs in 3-D ICs., , , , , , and . DAC, page 1031-1036. ACM, (2012)A Low Complexity Transmitter Architecture and Its Application to PAPR Reduction in SFBC MIMO-OFDM Systems., , and . ICC, page 1-5. IEEE, (2010)Scan based speed-path debug for a microprocessor., , , , , , and . European Test Symposium, page 207-212. IEEE Computer Society, (2010)