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LPTest: a Flexible Low-Power Test Pattern Generator.

, , and . J. Electron. Test., 25 (6): 323-335 (2009)

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ICCAD-2017 CAD contest in net open location finder with obstacles: Invited paper., , , , and . ICCAD, page 863-866. IEEE, (2017)2021 ICCAD CAD Contest Problem B: Routing with Cell Movement Advanced: Invited Paper., , , and . ICCAD, page 1-5. IEEE, (2021)ICCAD-2020 CAD contest in Routing with Cell Movement : Invited Talk., , , and . ICCAD, page 69:1-69:4. IEEE, (2020)Machine Learning-based Structural Pre-route Insertability Prediction and Improvement with Guided Backpropagation., , , , , , and . ASP-DAC, page 678-683. ACM, (2021)Lookahead Placement Optimization with Cell Library-based Pin Accessibility Prediction via Active Learning., , , , , , and . ISPD, page 65-72. ACM, (2020)Pin Accessibility Prediction and Optimization with Deep Learning-based Pin Pattern Recognition., , , , , , and . DAC, page 220. ACM, (2019)Invited Paper: 2023 ICCAD CAD Contest Problem B: 3D Placement with Macros., , , , , and . ICCAD, page 1-6. IEEE, (2023)2022 ICCAD CAD Contest Problem B: 3D Placement with D2D Vertical Connections., , , , , and . ICCAD, page 94:1-94:5. ACM, (2022)LPTest: a Flexible Low-Power Test Pattern Generator., , and . J. Electron. Test., 25 (6): 323-335 (2009)An Efficient Peak Power Reduction Technique for Scan Testing., , and . ATS, page 111-114. IEEE, (2007)