Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

SECCS: SECure Context Saving for IoT Devices., , , , , and . CoRR, (2019)A New Recovery Scheme Against Short-to-Long Duration Transient Faults in Combinational Logic., , , , and . J. Electron. Test., 29 (3): 331-340 (2013)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Experimentations on scan chain encryption with PRESENT., , , and . IVSW, page 45-50. IEEE, (2017)A New Secure Stream Cipher for Scan Chain Encryption., , , , , and . IVSW, page 68-73. IEEE, (2018)On-chip test comparison for protecting confidential data in secure ICs., , , and . European Test Symposium, page 1. IEEE Computer Society, (2012)Frontside Versus Backside Laser Injection: A Comparative Study., , , , and . JETC, 13 (1): 6:1-6:15 (2016)Operators allocation in the silicon compiler SCOOP., , and . Integr., 8 (2): 99-109 (1989)New security threats against chips containing scan chain structures., , , and . HOST, page 110. IEEE Computer Society, (2011)Test control for secure scan designs., , , and . ETS, page 190-195. IEEE Computer Society, (2005)