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ASTEP (2005-2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure.

, , , , , , and . Microelectron. Reliab., 55 (9-10): 1506-1511 (2015)

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Soft-Error Rate of Advanced SRAM Memories: Modeling and Monte Carlo Simulation, , , , , and . Numerical Simulation -- From Theory to Industry, chapter 15, InTech, (September 2012)Muons and thermal neutrons SEU characterization of 28nm UTBB FD-SOI and Bulk eSRAMs., , , , and . IRPS, page 2. IEEE, (2015)Usefulness and effectiveness of HW and SW protection mechanisms in a processor-based system., , , and . ICECS, page 113-116. IEEE, (2008)2P2Idb: a structural database dedicated to orthosteric modulation of protein-protein interactions., , , , , , , and . Nucleic Acids Res., 41 (Database-Issue): 824-827 (2013)Reduced Instrumentation and Optimized Fault Injection Control for Dependability Analysis., , and . VLSI-SoC, page 391-396. IEEE, (2006)CovaDOTS: In Silico Chemistry-Driven Tool to Design Covalent Inhibitors Using a Linking Strategy., , , , , and . J. Chem. Inf. Model., 59 (4): 1472-1485 (2019)A 240mV 1MHz, 340mV 10MHz, 40nm CMOS, 252 bits frame decoder using ultra-low voltage circuit design platform., , , , , and . ICECS, page 117-120. IEEE, (2011)A Radiation Hardened Nano-Power 8Mb SRAM in 130nm CMOS., , , , , , and . ISQED, page 23-29. IEEE Computer Society, (2008)A 2.7pJ/cycle 16MHz SoC with 4.3nW power-off ARM Cortex-M0+ core in 28nm FD-SOI., , , , , and . ESSCIRC, page 153-162. IEEE, (2017)An approach to reduce computational cost in combinatorial logic netlist reliability analysis using circuit clustering and conditional probabilities., , , and . IOLTS, page 98-103. IEEE Computer Society, (2011)