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Disambiguation of "Lin, Xijiang"

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On generating high quality tests based on cell functions.

, and . ITC, page 1-9. IEEE, (2015)

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Lin Lin

Lin Lin

Lin Lin

Lin Lin

Lin Lin

 

Other publications of authors with the same name

Using dynamic shift to reduce test data volume in high-compression designs., , and . ETS, page 1-6. IEEE, (2014)The Impacts of Untestable Defects on Transition Fault Testing., and . VTS, page 2-7. IEEE Computer Society, (2006)Novel Techniques for Achieving High At-Speed Transition Fault Test Coverage for Motorola's Microprocessors Based on PowerPC(tm) Instruction Set Architecture., , , , , and . VTS, page 3-8. IEEE Computer Society, (2002)Detecting and diagnosing open defects., , , , , and . ITC, page 811. IEEE Computer Society, (2010)On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults., , and . ATS, page 97-102. IEEE Computer Society, (2015)Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits., , and . VLSID, page 399-404. IEEE Computer Society, (2015)Thermal-Aware Small-Delay Defect Testing in Integrated Circuits for Mitigating Overkill., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (3): 499-512 (2016)Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality., , , , , and . DATE, page 56-61. IEEE Computer Society, (2005)On Achieving Maximal Chain Diagnosis Resolution through Test Pattern Selection., , and . ATS, page 132-137. IEEE Computer Society, (2016)Adaptive Low Shift Power Test Pattern Generator for Logic BIST., and . Asian Test Symposium, page 355-360. IEEE Computer Society, (2010)