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Reliability Considerations forMechatronic Systems on the Basis of a State Model.

, , , and . ARCS Workshops, volume P-41 of LNI, page 106-112. GI, (2004)

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Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms., , , and . EDCC, volume 1667 of Lecture Notes in Computer Science, page 339-350. Springer, (1999)Generating pattern sequences for the pseudo-exhaustive test of MOS-circuits., and . FTCS, page 36-41. IEEE Computer Society, (1988)ETS 2015 best paper., and . ETS, page 1. IEEE, (2016)Deterministic Pattern Generation for Weighted Random Pattern Testing., and . ED&TC, page 30-36. IEEE Computer Society, (1996)Robust Pattern Generation for Small Delay Faults Under Process Variations., , , , , , and . ITC, page 111-116. IEEE, (2023)A Hybrid Protection Scheme for Reconfigurable Scan Networks., , and . VTS, page 1-7. IEEE, (2021)Using mission logic for embedded testing., and . DATE, page 805. IEEE Computer Society, (2001)Optimized Selection of Frequencies for Faster-Than-at-Speed Test., , , , , and . ATS, page 109-114. IEEE Computer Society, (2015)Efficient Pattern Mapping for Deterministic Logic BIST., , , , , and . ITC, page 48-56. IEEE Computer Society, (2004)Adapting an SoC to ATE Concurrent Test Capabilities., , , and . ITC, page 1169-1175. IEEE Computer Society, (2002)