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Другие публикации лиц с тем же именем

Reliability Study of 14 nm Scan Chains and Its Application to Hardware Security., и . ITC, стр. 28-35. IEEE, (2022)On-chip power supply noise measurement using Time Resolved Emission (TRE) waveforms of Light Emission from Off-State Leakage Current (LEOSLC)., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2009)Counterfeit IC detection using light emission., , и . ITC, стр. 1-8. IEEE Computer Society, (2014)Root cause identification of an hard-to-find on-chip power supply coupling fail., , , , , , и . ITC, стр. 1-7. IEEE Computer Society, (2012)Mapping of Oriental Migratory Locust Habitat Using Landsat OLI Images in Dongying City, China., , , , , и . Agro-Geoinformatics, стр. 1-5. IEEE, (2018)Tester-based optical and electrical diagnostic system and techniques., и . VTS, стр. 209-214. IEEE Computer Society, (2012)Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation., , , , , и . ESSDERC, стр. 293-296. IEEE, (2022)Innovative practices session 3C hardware security., , и . VTS, стр. 1. IEEE Computer Society, (2017)Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip., , , , , и . ITC, стр. 717-726. IEEE Computer Society, (1998)Latchup Analysis Using Emission Microscopy., , , , , , , , , и . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)