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Improving post-silicon error detection with topological selection of trace signals., , , , и . VLSI-SoC, стр. 1-6. IEEE, (2017)A Technique for Electrical Error Localization with Learning Methods During Post-silicon Debugging., , и . IGSC, стр. 1-8. IEEE, (2018)Black-Hat High-Level Synthesis: Myth or Reality?, , , и . IEEE Trans. Very Large Scale Integr. Syst., 27 (4): 913-926 (2019)Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (1): 248-261 (2020)Guest Editorial., , и . J. Electron. Test., 35 (5): 579-580 (2019)Circuit Topology-Aware Vaccination-Based Hardware Trojan Detection., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (9): 2852-2862 (сентября 2023)RTL-ConTest: Concolic Testing on RTL for Detecting Security Vulnerabilities., , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (3): 466-477 (2022)CAD-Base: An Attack Vector into the Electronics Supply Chain., , , , , , и . ACM Trans. Design Autom. Electr. Syst., 24 (4): 38:1-38:30 (2019)Unlocking Hardware Security Assurance: The Potential of LLMs., , , , , , , и . CoRR, (2023)COPPTCHA: COPPA Tracking by Checking Hardware-Level Activity., , , и . IEEE Trans. Inf. Forensics Secur., (2020)