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Laser-induced fault effects in security-dedicated circuits., , , , , , , , , и 9 other автор(ы). VLSI-SoC, стр. 1-6. IEEE, (2014)A Flexible SoPC-based Fault Injection Environment., , и . DDECS, стр. 192-197. IEEE Computer Society, (2006)Statistical fault injection: Quantified error and confidence., , , и . DATE, стр. 502-506. IEEE, (2009)IDSM: An improved disjoint signature monitoring scheme for processor behavioral checking., , и . LATW, стр. 1-6. IEEE, (2014)Using multifunctional standardized stack as universal spintronic technology for IoT., , , , , , , , , и 8 other автор(ы). DATE, стр. 931-936. IEEE, (2018)Evaluation of Register-Level Protection Techniques for the Advanced Encryption Standard by Multi-Level Fault Injections., , и . DFT, стр. 499-507. IEEE Computer Society, (2007)A Novel Double-Data-Rate AES Architecture Resistant against Fault Injection., , и . FDTC, стр. 54-61. IEEE Computer Society, (2007)Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , и 5 other автор(ы). VLSI-SoC (Selected Papers), том 464 из IFIP Advances in Information and Communication Technology, стр. 220-240. Springer, (2014)Evaluation of SET and SEU Effects at Multiple Abstraction Levels., , и . IOLTS, стр. 309-312. IEEE Computer Society, (2005)On error models for RTL security evaluations., , , , , и . DTIS, стр. 1-6. IEEE, (2014)