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Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator.

, , , , and . IEA/AIE, volume 7906 of Lecture Notes in Computer Science, page 635-643. Springer, (2013)

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The Tires Worn Monitoring Prototype System Using Image Clustering Technology., , , and . IEA/AIE, volume 7906 of Lecture Notes in Computer Science, page 626-634. Springer, (2013)Quality Assessment Model for Critical Manufacturing Process of Crystal Oscillator., , , , and . IEA/AIE, volume 7906 of Lecture Notes in Computer Science, page 635-643. Springer, (2013)