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Disambiguation of "Zorian, Yervant"

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, , , , , and . DATE, page 66. IEEE Computer Society / ACM, (2000)

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Other publications of authors with the same name

System chip test: how will it impact your design?, and . DAC, page 136-141. ACM, (2000)Panel Session - Vertical integration versus disaggregation.. DATE, page 602. IEEE, (2009)International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia., , , , and . ITC, page 1-4. IEEE, (2019)Leveraging Infrastructure IP for SoC Yield.. Asian Test Symposium, page 3-5. IEEE Computer Society, (2003)T1: Design for Manufacturability., and . Asian Test Symposium, IEEE Computer Society, (2005)Embedded tutorial: TRP: integrating embedded test and ATE., , , , , , , , and . DATE, page 34-37. IEEE Computer Society, (2001)Securing test infrastructure of system-on-chips., , , and . EWDTS, page 1-4. IEEE Computer Society, (2016)Experimental study on Hamming and Hsiao codes in the context of embedded applications., , , and . EWDTS, page 1-4. IEEE Computer Society, (2017)Analyzing the test generation problem for an application-oriented test of FPGAs., , , , and . ETW, page 75-80. IEEE Computer Society, (2000)An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories., , and . VTS, page 95-100. IEEE Computer Society, (2008)