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Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectrics., , , , , , , , , and . Microelectron. Reliab., 45 (7-8): 1041-1050 (2005)Small Complexity Classes for Computable Analysis., and . MFCS (2), volume 8635 of Lecture Notes in Computer Science, page 432-444. Springer, (2014)Improvement of epitaxial channel quality on heavily arsenic- and boron-doped Si surfaces and impact on tunnel FET performance., , , , , , , , , and 1 other author(s). ESSDERC, page 182-185. IEEE, (2014)PBTI for N-type tunnel FinFETs., , , , , , , , , and 4 other author(s). ICICDT, page 1-4. IEEE, (2015)Computational Complexity of Smooth Differential Equations., , , and . Logical Methods in Computer Science, (2014)Analysis of a Multi-Oscillated Current Resonant Type DC-DC Converter., , , and . IEICE Trans. Commun., 91-B (10): 3307-3312 (2008)Two-step annealing effects on ultrathin EOT higher-k (k = 40) ALD-HfO2 gate stacks., , , , and . ESSDERC, page 81-84. IEEE, (2012)Evaluation of Apparent Noise on CT Images Using Moving Average Filters., , , , , and . J. Digit. Imaging, 35 (1): 77-85 (2022)Performance limit of parallel electric field tunnel FET and improvement by modified gate and channel configurations., , , , , , , , , and 2 other author(s). ESSDERC, page 45-48. IEEE, (2013)Computational Complexity of Smooth Differential Equations., , , and . MFCS, volume 7464 of Lecture Notes in Computer Science, page 578-589. Springer, (2012)