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Cognitive approach to support dynamic aging compensation., , , , , , , , and . ITC, page 1-7. IEEE, (2017)A thorough investigation of MOSFETs NBTI degradation., , , , , , and . Microelectron. Reliab., 45 (1): 83-98 (2005)Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation., , , , and . PATMOS, volume 4644 of Lecture Notes in Computer Science, page 191-200. Springer, (2007)NBTI degradation: From physical mechanisms to modelling., , and . Microelectron. Reliab., 46 (1): 1-23 (2006)Activity profiling: Review of different solutions to develop reliable and performant design., , , , , , , , , and . IOLTS, page 47-50. IEEE, (2016)Designing in reliability in advanced CMOS technologies., , , , , , , , and . Microelectron. Reliab., 46 (9-11): 1464-1471 (2006)Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs., , , , , , , and . Microelectron. Reliab., 45 (9-11): 1370-1375 (2005)Dynamic aging compensation and Safety measures in Automotive environment., , , , , , , and . IOLTS, page 106-112. IEEE, (2017)Timing in-situ monitors: Implementation strategy and applications results., , , , , , , and . CICC, page 1-4. IEEE, (2015)A Game Based Graphical Password Authentication System to Prevent Shoulder-Surfing. International Journal of Trend in Scientific Research and Development, 2 (3): 479-483 (April 2018)