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A Framework of High-quality Transition Fault ATPG for Scan Circuits.

S. Kajihara, S. Morishima, A. Takuma, X. Wen, T. Maeda, S. Hamada, и Y. Sato. ITC, стр. 1-6. IEEE Computer Society, (2006)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

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