Author of the publication

Low-cost digital solution for production test of ZigBee transmitters Special Session ÄMS-RF testing".

, , , and . LATS, page 1-2. IEEE, (2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , and . NEWCAS, page 1-4. IEEE, (2013)Low-cost SNR estimation of analog signals using standard digital automated test equipment (ATE)., and . NEWCAS, page 197-200. IEEE, (2012)Combining Functional and Structural Approaches for Switched-Current Circuit Testing., , , and . J. Electron. Test., 16 (3): 259-267 (2000)EVM measurement of RF ZigBee transceivers using standard digital ATE., , , and . DFT, page 1-6. IEEE, (2020)Improving Defect Detection in Static-Voltage Testing., , and . IEEE Des. Test Comput., 19 (6): 83-89 (2002)Which metrics to use for RF indirect test strategy?, , , , , and . SMACD, page 73-76. IEEE, (2019)On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints., , , , , , , , , and . J. Electron. Test., 34 (3): 281-290 (2018)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , and . LATW, page 174-179. IEEE, (2002)Testing the Configurable Analog Blocks of Field Programmable Analog Arrays., , , , and . ITC, page 893-902. IEEE Computer Society, (2004)BISTing Switched-Current Circuits., , , and . Asian Test Symposium, page 372-377. IEEE Computer Society, (1998)